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eb001/tb/shinTest/testcase/rwregs.py

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生成测试用例数据的python代码太长了,利用python的包等结构分割代码,当前初步做了分割
2025-07-29 18:57:45 +08:00
from pyutils import *
为多相位模拟增加命令行,增加8b10b切换的测试
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from .environment import *
生成测试用例数据的python代码太长了,利用python的包等结构分割代码,当前初步做了分割
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import time
import random
def tc1():
修改测试用例
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gen_file_def = "regtest_tc01"
生成测试用例数据的python代码太长了,利用python的包等结构分割代码,当前初步做了分割
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sm_idx = 0
增加新的寄存器测试用例
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tc_des = "测试寄存器的读写状态，将系统改为8B10B进行通信。特别测试SPI/QSPI读写密码正确和不正确的情况下，对读写的封堵。\\n"
为多相位模拟增加命令行,增加8b10b切换的测试
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genPkt = GenPkt()
genPkt.clean()
dev_num = get_slv_dev_num()
genPkt.addBeforeExc(genTcStartFrameCode(gen_file_def, tc_des))
增加新的寄存器测试用例
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change_8b10b_code1 = ""
为多相位模拟增加命令行,增加8b10b切换的测试
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for i in range(dev_num + 1):
增加新的寄存器测试用例
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change_8b10b_code1 = change_8b10b_code1 + genIFRwDataCode(i, 0x004c, True, 2, [0x0, 0x59])\
+genIFRwDataCode(i, 0x004c, False, 2)
change_8b10b_code2 = ""
for i in range(dev_num + 1):
change_8b10b_code2 = change_8b10b_code2 + genIFRwDataCode(i, 0x004c, True, 2, [0x1, 0x59])\
+genIFRwDataCode(i, 0x004c, False, 2)
invalid_change_8b10b_code1 = ""
for i in range(dev_num + 1):
invalid_change_8b10b_code1 = invalid_change_8b10b_code1 + genIFRwDataCode(i, 0x004c, True, 2, [0x0, 0x32])\
+genIFRwDataCode(i, 0x004c, False, 2)
invalid_change_8b10b_code2 = ""
for i in range(dev_num + 1):
invalid_change_8b10b_code2 = invalid_change_8b10b_code2 + genIFRwDataCode(i, 0x004c, True, 2, [0x1, 0x43])\
+genIFRwDataCode(i, 0x004c, False, 2)
invalid_change_8b10b_code3 = ""
for i in range(dev_num + 1):
invalid_change_8b10b_code3 = invalid_change_8b10b_code3 + genIFRwDataCode(i, 0x004c, True, 1, [0x0, ])\
+genIFRwDataCode(i, 0x004c, False, 2)
invalid_change_8b10b_code4 = ""
for i in range(dev_num + 1):
invalid_change_8b10b_code4 = invalid_change_8b10b_code4 + genIFRwDataCode(i, 0x004c, True, 1, [0x1, ])\
+genIFRwDataCode(i, 0x004c, False, 2)
invalid_change_8b10b_code5 = ""
for i in range(dev_num + 1):
invalid_change_8b10b_code5 = invalid_change_8b10b_code5 + genIFRwDataCode(i, 0x004c, True, 2, [0x30, 0x59])\
+genIFRwDataCode(i, 0x004c, False, 2)
invalid_change_8b10b_code6 = ""
for i in range(dev_num + 1):
invalid_change_8b10b_code6 = invalid_change_8b10b_code6 + genIFRwDataCode(i, 0x004c, True, 2, [0x23, 0x59])\
为多相位模拟增加命令行,增加8b10b切换的测试
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+genIFRwDataCode(i, 0x004c, False, 2)
增加新的寄存器测试用例
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default_trans_code = ""
for i in range(dev_num + 1):
default_trans_code = default_trans_code + using_proper_transcode(i)
genPkt.addAfterExc(genMessageCode("--正确的key")
+change_8b10b_code1
+genMessageCode("--错误的key")
+invalid_change_8b10b_code4
+genMessageCode("--错误的key")
+invalid_change_8b10b_code1
+genMessageCode("--错误的key")
+invalid_change_8b10b_code2
+genMessageCode("--正确的key")
+change_8b10b_code2
+genMessageCode("--错误的key")
+invalid_change_8b10b_code3
+genMessageCode("--错误的key")
+invalid_change_8b10b_code1
+genMessageCode("--错误的key")
+invalid_change_8b10b_code2
+genMessageCode("--正确的key_错误的数据")
+invalid_change_8b10b_code5
+invalid_change_8b10b_code6
+genMessageCode("--恢复默认的配置")
+default_trans_code
为多相位模拟增加命令行,增加8b10b切换的测试
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+genTcEndFrameCode(gen_file_def))
生成测试用例数据的python代码太长了,利用python的包等结构分割代码,当前初步做了分割
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genPkt.gen("./generated/shin/%s.vh"%(gen_file_def, ), 1)
初步实现python生成测试用例，并挂接.v文件，无需手工写.v文件
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return gen_file_def
增加8b10b的测试用例，并与4b5b共享测试用例
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def tc2():
gen_file_def = "regtest_tc02"
sm_idx = 0
增加新的测试用例以及相关的对比数据
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tc_des = "测试寄存器的读写状态，交换上下行管脚。特别测试SPI/QSPI读写密码正确和不正确的情况下，对读写的封堵。\\n"
增加8b10b的测试用例，并与4b5b共享测试用例
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genPkt = GenPkt()
genPkt.clean()
dev_num = get_slv_dev_num()
增加新的测试用例以及相关的对比数据
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genPkt.addBeforeExc(genTcStartFrameCode(gen_file_def, tc_des))
增加8b10b的测试用例，并与4b5b共享测试用例
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增加新的测试用例以及相关的对比数据
2025-09-11 11:58:52 +08:00
change_pinsw_code1 = ""
增加8b10b的测试用例，并与4b5b共享测试用例
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for i in range(dev_num + 1):
增加新的测试用例以及相关的对比数据
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change_pinsw_code1 = change_pinsw_code1 + genIFRwDataCode(i, 0x004a, True, 2, [0x0, 0x58])\
+genIFRwDataCode(i, 0x004a, False, 2)
change_pinsw_code2 = ""
for i in range(dev_num + 1):
change_pinsw_code2 = change_pinsw_code2 + genIFRwDataCode(i, 0x004a, True, 2, [0x1, 0x58])\
+genIFRwDataCode(i, 0x004a, False, 2)
invalid_change_pinsw_code1 = ""
for i in range(dev_num + 1):
invalid_change_pinsw_code1 = invalid_change_pinsw_code1 + genIFRwDataCode(i, 0x004a, True, 2, [0x0, 0x32])\
+genIFRwDataCode(i, 0x004a, False, 2)
invalid_change_pinsw_code2 = ""
for i in range(dev_num + 1):
invalid_change_pinsw_code2 = invalid_change_pinsw_code2 + genIFRwDataCode(i, 0x004a, True, 2, [0x1, 0x43])\
+genIFRwDataCode(i, 0x004a, False, 2)
invalid_change_pinsw_code3 = ""
for i in range(dev_num + 1):
invalid_change_pinsw_code3 = invalid_change_pinsw_code3 + genIFRwDataCode(i, 0x004a, True, 1, [0x0, ])\
+genIFRwDataCode(i, 0x004a, False, 2)
invalid_change_pinsw_code4 = ""
for i in range(dev_num + 1):
invalid_change_pinsw_code4 = invalid_change_pinsw_code4 + genIFRwDataCode(i, 0x004a, True, 1, [0x1, ])\
+genIFRwDataCode(i, 0x004a, False, 2)
invalid_change_pinsw_code5 = ""
for i in range(dev_num + 1):
invalid_change_pinsw_code5 = invalid_change_pinsw_code5 + genIFRwDataCode(i, 0x004a, True, 2, [0x30, 0x58])\
+genIFRwDataCode(i, 0x004a, False, 2)
invalid_change_pinsw_code6 = ""
for i in range(dev_num + 1):
invalid_change_pinsw_code6 = invalid_change_pinsw_code6 + genIFRwDataCode(i, 0x004a, True, 2, [0x23, 0x58])\
+genIFRwDataCode(i, 0x004a, False, 2)
增加8b10b的测试用例，并与4b5b共享测试用例
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增加新的测试用例以及相关的对比数据
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default_pinsw_code = ""
for i in range(dev_num + 1):
default_pinsw_code = default_pinsw_code + genIFRwDataCode(i, 0x004a, True, 2, [0, 0x58])
genPkt.addAfterExc(genMessageCode("--正确的key")
+change_pinsw_code1
+genMessageCode("--错误的key")
+invalid_change_pinsw_code4
+genMessageCode("--错误的key")
+invalid_change_pinsw_code1
+genMessageCode("--错误的key")
+invalid_change_pinsw_code2
+genMessageCode("--正确的key")
+change_pinsw_code2
+genMessageCode("--错误的key")
+invalid_change_pinsw_code3
+genMessageCode("--错误的key")
+invalid_change_pinsw_code1
+genMessageCode("--错误的key")
+invalid_change_pinsw_code2
+genMessageCode("--正确的key_错误的数据")
+invalid_change_pinsw_code5
+invalid_change_pinsw_code6
+genMessageCode("--恢复默认的配置")
+default_pinsw_code
增加8b10b的测试用例，并与4b5b共享测试用例
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+genTcEndFrameCode(gen_file_def))
genPkt.gen("./generated/shin/%s.vh"%(gen_file_def, ), 1)
增加新的寄存器测试用例
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return gen_file_def
def tc3():
gen_file_def = "regtest_tc03"
sm_idx = 0
tc_des = "测试SM0~SM7的的长度寄存器的读写，要求在内部有元素的情况下，不能改写其长度。\\n"
genPkt = GenPkt()
genPkt.clean()
genPkt.setPktType(0)
dev_num = get_slv_dev_num()
chang_sm_length = ""
for i in range(dev_num + 1):
chang_sm_length = chang_sm_length + genIFRwDataCode(i, 0x0302, True, 2, [0x20, 0x00])
genPkt.addBeforeExc(genTcStartFrameCode(gen_file_def, tc_des)
+chang_sm_length
+genMessageCode("--清除主中断")
+genIFRwDataCode(0, 0x78, True, 4, [0xff, 0xff, 0xff, 0xff])
)
genPkt.addSubPkt(0x0, 0x0, 0x0800, 0xe, 0x20, [0, ] * 0x20)
chang_sm_length = ""
for i in range(dev_num + 1):
chang_sm_length = chang_sm_length + genIFRwDataCode(i, 0x0302, True, 2, [0x40, 0x00])
read_sm_status = ""
for i in range(dev_num + 1):
read_sm_status = read_sm_status + genIFRwDataCode(i, 0x0300, False, 4)
reset_sm = ""
for i in range(dev_num + 1):
reset_sm = reset_sm + genIFRwDataCode(i, 0x0300, True, 1, [0, ])
genPkt.addAfterExc(genWriteTransLenCode(gen_file_def, sm_idx)
+genWriteTransPktCode(gen_file_def, sm_idx)
+genTrgTransPktCode(gen_file_def, sm_idx)
+genReadAckPktCode(gen_file_def, sm_idx)
+chang_sm_length
+read_sm_status
+reset_sm
+read_sm_status
增加新的测试用例以及相关的对比数据
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+genMessageCode("--清除主中断")
+genIFRwDataCode(0, 0x78, True, 4, [0xff, 0xff, 0xff, 0xff])
+genIFRwDataCode(1, 0x78, True, 4, [0xff, 0xff, 0xff, 0xff])
+genIFRwDataCode(2, 0x78, True, 4, [0xff, 0xff, 0xff, 0xff])
+genIFRwDataCode(3, 0x78, True, 4, [0xff, 0xff, 0xff, 0xff])
+genIFRwDataCode(4, 0x78, True, 4, [0xff, 0xff, 0xff, 0xff])
增加新的寄存器测试用例
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+genTcEndFrameCode(gen_file_def))
genPkt.gen("./generated/shin/%s.vh"%(gen_file_def, ), 1)
return gen_file_def
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